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Destructive Testing On SPICE
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Bret Cahill  
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 More options Jun 29, 9:01 pm
Newsgroups: sci.electronics.basics
From: Bret Cahill <BretCah...@peoplepc.com>
Date: Tue, 29 Jun 2010 07:01:59 -0700 (PDT)
Local: Tues, Jun 29 2010 9:01 pm
Subject: Destructive Testing On SPICE
Is there any circuit simulator that accounts for overload and failure
of components?

Bret Cahill


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John Larkin  
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 More options Jun 29, 10:36 pm
Newsgroups: sci.electronics.basics
From: John Larkin <jjlar...@highNOTlandTHIStechnologyPART.com>
Date: Tue, 29 Jun 2010 08:36:19 -0700
Local: Tues, Jun 29 2010 10:36 pm
Subject: Re: Destructive Testing On SPICE
On Tue, 29 Jun 2010 07:01:59 -0700 (PDT), Bret Cahill

<BretCah...@peoplepc.com> wrote:
>Is there any circuit simulator that accounts for overload and failure
>of components?

>Bret Cahill

One of the dorkier simulators would put little animated flames over
the symbols of parts that dissipated too much power.

But that's a gimmick. It's hard for Spice to understand your intent,
application, heatsinking, and duty cycles.

LT Spice will generate an "efficiency report" which lists power
dissipation of various components.

John


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Bret Cahill  
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 More options Jun 30, 12:53 am
Newsgroups: sci.electronics.basics
From: Bret Cahill <BretCah...@peoplepc.com>
Date: Tue, 29 Jun 2010 10:53:09 -0700 (PDT)
Local: Wed, Jun 30 2010 12:53 am
Subject: Re: Destructive Testing On SPICE

> >Is there any circuit simulator that accounts for overload and failure
> >of components?

> >Bret Cahill

> One of the dorkier simulators would put little animated flames over
> the symbols of parts that dissipated too much power.

> But that's a gimmick. It's hard for Spice to understand your intent,
> application, heatsinking, and duty cycles.

It would have to be set up with inputs for current, wattage or voltage
limits.  Usually in reliability you have one distribution curve for
strength and another for expected loading over the lifetime of a
structure.

Another much more daunting but related undertaking would be to take
the electronics / mechanics analogy much further, i.e., determining
the electronic analogues to Coriolis forces, angular momentum, moment
of inertia in beam bending, etc.

The principle difference is few care if someone burns up a chip but
just about everyone cares if an RC building or prestressed concrete
overpass comes down.  Even that difference fades in power production.

A serious attempt at such a project would probably yield a lot of
valuable insights and innovations long before it was completed.

Instead of using SPICE for simple mechanical impedance problems a
generalized application could be used for either.

A single click would convert mechanical to electronic and vice versa..

Bret Cahill


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John Larkin  
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 More options Jun 30, 3:23 am
Newsgroups: sci.electronics.basics
From: John Larkin <jjlar...@highNOTlandTHIStechnologyPART.com>
Date: Tue, 29 Jun 2010 13:23:29 -0700
Local: Wed, Jun 30 2010 3:23 am
Subject: Re: Destructive Testing On SPICE
On Tue, 29 Jun 2010 10:53:09 -0700 (PDT), Bret Cahill

Those of us who are electronics design engineers don't work by
analogy. We use real facts and hard numbers.

There are accepted ways to calculate MTBF of electronic systems, and
accepted ways to stress and test actual working hardware. A good EE
can design electronics that has multiples longer MTBF than the
MIL-HDBK-217 or Bellcore calculations suggest. A bad designer will
often come in much, much worse.

>The principle difference is few care if someone burns up a chip but
>just about everyone cares if an RC building or prestressed concrete
>overpass comes down.  Even that difference fades in power production.

>A serious attempt at such a project would probably yield a lot of
>valuable insights and innovations long before it was completed.

>Instead of using SPICE for simple mechanical impedance problems a
>generalized application could be used for either.

>A single click would convert mechanical to electronic and vice versa..

None of that last part makes sense to me.

John


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Bret Cahill  
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 More options Jun 30, 5:54 am
Newsgroups: sci.electronics.basics
From: Bret Cahill <BretCah...@peoplepc.com>
Date: Tue, 29 Jun 2010 15:54:52 -0700 (PDT)
Local: Wed, Jun 30 2010 5:54 am
Subject: Re: Destructive Testing On SPICE

This isn't about a solution to a specific problem.

It's a fishing expedition for new ideas.

> There are accepted ways to calculate MTBF of electronic systems, and
> accepted ways to stress and test actual working hardware. A good EE
> can design electronics that has multiples longer MTBF than the
> MIL-HDBK-217 or Bellcore calculations suggest. A bad designer will
> often come in much, much worse.

The goal here would be new methods and new devices.

> >The principle difference is few care if someone burns up a chip but
> >just about everyone cares if an RC building or prestressed concrete
> >overpass comes down.  Even that difference fades in power production.

> >A serious attempt at such a project would probably yield a lot of
> >valuable insights and innovations long before it was completed.

> >Instead of using SPICE for simple mechanical impedance problems a
> >generalized application could be used for either.

> >A single click would convert mechanical to electronic and vice versa..

> None of that last part makes sense to me.

You draw a low pass fliter on the program, say a capacitor to ground,
and the mechanical equivalent, say a spring and damper, is
automatically drawn up as well.

A couple issues may complicate things:

A lot of the analogues probably wouldn't "map" one to one and anyone
using it would need to know which analogue to specify.

The hardest part would be formalizing the math for all those messy
mechanical situations that are "merely omitted" from many engineering
programs.   The WTC "pancaked" down because the architect didn't think
joints were glamorous enough for his time.

Some researchers at MIT took a better look at the joints _after_ 9/11.

Bret Cahill


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Bret Cahill  
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 More options Jun 30, 5:59 am
Newsgroups: sci.electronics.basics
From: Bret Cahill <BretCah...@peoplepc.com>
Date: Tue, 29 Jun 2010 15:59:31 -0700 (PDT)
Local: Wed, Jun 30 2010 5:59 am
Subject: Re: Destructive Testing On SPICE

Different analogy.  The goal here isn't just calculating but new
devices and methods of dealing with older problems.

Bret Cahill


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Jamie  
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 More options Jun 30, 7:01 am
Newsgroups: sci.electronics.basics
From: Jamie <jamie_ka1lpa_not_valid_after_ka1l...@charter.net>
Date: Tue, 29 Jun 2010 20:01:55 -0400
Local: Wed, Jun 30 2010 7:01 am
Subject: Re: Destructive Testing On SPICE
Bret Cahill wrote:
> Is there any circuit simulator that accounts for overload and failure
> of components?

> Bret Cahill

The "Work Bench" Program? I seem to remember my kid using that in school
and it would generate some nice effects if you made a mistake in the
circuit that would otherwise destroy something..

Jamie


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Bret Cahill  
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 More options Jul 1, 10:32 am
Newsgroups: sci.electronics.basics
From: Bret Cahill <BretCah...@peoplepc.com>
Date: Wed, 30 Jun 2010 20:32:23 -0700 (PDT)
Local: Thurs, Jul 1 2010 10:32 am
Subject: Re: Destructive Testing On SPICE

> > Is there any circuit simulator that accounts for overload and failure
> > of components?

> > Bret Cahill

> The "Work Bench" Program? I seem to remember my kid using that in school
> and it would generate some nice effects if you made a mistake in the
> circuit that would otherwise destroy something..

Only in power generation -- megawatts -- does the destruction of
anything in a circuit amount to a hill of beans.

You can fry computer chips all day long and never attract more
attention than Al Gore in a dust devil.

Bret Cahill


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Jim Thompson  
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 More options Jul 29, 3:28 am
Newsgroups: sci.electronics.basics
From: Jim Thompson <To-Email-Use-The-Envelope-I...@On-My-Web-Site.com>
Date: Wed, 28 Jul 2010 13:28:05 -0700
Local: Thurs, Jul 29 2010 3:28 am
Subject: Re: Destructive Testing On SPICE
On Tue, 29 Jun 2010 07:01:59 -0700 (PDT), Bret Cahill

<BretCah...@peoplepc.com> wrote:
>Is there any circuit simulator that accounts for overload and failure
>of components?

>Bret Cahill

The best way is to write your own macros.  For instance I have a macro
that checks MOS for hot electron SOA issues.

                                        ...Jim Thompson
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